FRI October 9

Friday, October 9 am - Workshops

Functional X-ray Imaging

LCLS-II Instrument refinement

Resonant Elastic and Inelastic X-ray Scattering applications for Quantum and Energy Materials: Transition-Edge-Sensor (TES) Applications

 

 

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Functional X-ray Imaging

 

LCLS-II Instrument Refinement
Organizers: David Fritz (Lead), 
Meng Liang, 
Hasan Yavas, Diling Zhu

 

Resonant Elastic and Inelastic X-ray Scattering applications for Quantum and Energy Materials: Transition-Edge-Sensor (TES) Applications
Organizer: Jun-Sik Lee

In X-ray applications, the resonant process has been considered an essential approach to exploring charge, spin, and orbital degrees of freedom in material sciences. Notably, the resonant x-ray scattering provides a unique opportunity for a study on materials with element-specific and spatial sensitivity. In particular, resonant elastic and inelastic x-ray scattering (REXS/RIXS) can deliver a piece of profound spectroscopic information as well. The recently developed transition-edge-sensor (TES) technology allows us to employ the REXS/RIXS approach more readily. In this workshop, we will discuss two things: (1) development status on REXS/RIXS capabilities at SSRL; 2) introducing current/future cutting-edge sciences via TES technology.